7.-8. septembril peab TTÜ arvutitehnika instituudis kaks loengut tunnustatud Duke’i ülikooli professor, IEEE fellow ja IEEE Computer Society Distinguished Visitor Krishnendu (Krish) Chakrabarty. Loengute teemadeks on uudsed, 3D integratsioonil põhinevad kiibid ning mikroelektroonikasüsteemide diagnoos. Loengute toimumist toetavad IEEE Eesti sektsioon ja IKT doktorikool.
7. september, kell 14:00, ruumis IT-209 (Raja 15)
Testing of 3D Integrated Circuits: Challenges and Emerging Solutions
8. september, kell 10:00, ruumis IT-209 (Raja 15)
Dictionary-Based Methods for Board-Level Fault Diagnosis
Loengute abstraktid ning prof. Chakrabarty biograafia on leitavad aadressil http://ati.ttu.ee/index.php?page=171&uudis=135
Lisainfo: Gert Jervan gert.jervan@pld.ttu.ee
Kaks loengut IEEE Distinguished Visitorilt
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